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RedHawk-SEM

RedHawk-SEM is a full-chip signal electro-migration (EM) solution. It supports TSMC’s 65nm/45nm EM rules and provides accurate and detailed average, RMS, and peak EM violation reports. RedHawk-SEM supports inter-cell and intra-cell (macro) signal net EM checking.

When operating on inter-cell nets, RedHawk-SEM delivers EM violation analysis at the gate-level. It verifies EM on signal lines between cells, as well as on the output of each driver cells. When operating on intra-cell (macro) nets, RedHawk-SEM delivers EM violation analysis at the transistor-level.

RedHawk-SEM eliminates excessive false violation results, thus enabling designers to focus on resolving real violations in their design. It’s intuitive, easy-to-use interface along with fast run times enable quick time-to-results and ease-of-results interpretation.